| 摘要 |
CORRELATION USING OVERLAYED PATCHES Disclosed is a computer implemented method for identifying a component tile within a target image. The method receives a plurality of distinct component tiles (320) and overlays (330) the plurality of component tiles to form an overlaid image (332). The overlaying is based on an embedded parameter value for each component tile. The method compares (430; 670,680) the target image with the overlayed image to determine a matching parameter value (phase, position, 680), and identifies (450,690) a component tile within the target image by determining that the embedded parameter value of the component tile is the closest of the embedded parameter values to the matching parameter value. Fig. 10A 1040 1000 1070 |
