| 发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF WAFER BURN-IN TEST FOR THE SAME |
| 摘要 |
A semiconductor memory device comprising a memory cell array with a plurality of word lines, first and second dummy word lines, and a dummy word line driver suitable for separately driving the first and second dummy word lines for a wafer burn-in test where the word lines are driven by group. |
| 申请公布号 |
US2015155054(A1) |
申请公布日期 |
2015.06.04 |
| 申请号 |
US201414280178 |
申请日期 |
2014.05.16 |
| 申请人 |
SK hynix Inc. |
发明人 |
LEE Hyun-Sung;PARK Kee-Teok |
| 分类号 |
G11C29/04 |
主分类号 |
G11C29/04 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A semiconductor memory device comprising:
a memory cell array including a plurality of word lines and first and second dummy word lines; and a dummy word line driver suitable for driving the first dummy word line and the second dummy word line separately for a wafer burn-in test where the word lines are driven by group. |
| 地址 |
Gyeonggi-do KR |
