发明名称 SCANNING MICROSCOPE
摘要 A scanning microscope includes a collecting lens that takes in a detection light, a focal position adjustment unit that moves in an optical axis direction of the collecting lens to make the collecting lens move in the optical axis direction, a detector positioned at a location that is optically conjugate to a pupil of the collecting lens, and a relay optical system that relays the pupil to the detector . The relay optical system includes a first optical element with a positive power, the first optical element being positioned in the focal position adjustment unit and converting the detection light that was converted by the collecting lens into a parallel light flux, into a convergent light flux to be emitted outside of the focal position adjustment unit, and a second optical element that is positioned outside of the focal position adjustment unit and between the detector and the first optical element.
申请公布号 US2015153554(A1) 申请公布日期 2015.06.04
申请号 US201414543394 申请日期 2014.11.17
申请人 OLYMPUS CORPORATION 发明人 TAMANO Shingo
分类号 G02B21/00;G02B21/02 主分类号 G02B21/00
代理机构 代理人
主权项 1. A scanning microscope comprising: a collecting lens that takes in a detection light from a sample; a focal position adjustment unit that moves in an optical axis direction of the collecting lens together with the collecting lens to make the collecting lens move in the optical axis direction; a detector positioned at a location that is optically conjugate to a pupil of the collecting lens; and a relay optical system that relays the pupil of the collecting lens to the detector, wherein the relay optical system includes: a first optical element having a positive power, the first optical element being positioned in the focal position adjustment unit and converting the detection light that was converted by the collecting lens into a parallel light flux, into a convergent light flux to be emitted outside of the focal position adjustment unit; and a second optical element that is positioned outside of the focal position adjustment unit and between the detector than and the first optical element.
地址 Tokyo JP