发明名称 Semiconductor Device
摘要 A highly reliable semiconductor device which uses an oxide semiconductor film for a backplane is provided. A semiconductor device includes a first conductive film, a first insulating film over the first conductive film, an oxide semiconductor film which is over the first insulating film and overlaps with the first conductive film, a second insulating film over the oxide semiconductor film, and a pair of second conductive films electrically connected to the oxide semiconductor film through an opening portion included in the second insulating film. The second insulating film overlaps with a region of the oxide insulating film in which a carrier flows between the pair of second conductive films and overlaps with end portions of the oxide semiconductor film.
申请公布号 US2015155387(A1) 申请公布日期 2015.06.04
申请号 US201414556769 申请日期 2014.12.01
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Yamazaki Shunpei;KATAYAMA Masahiro;MISAWA Chieko;YOKOYAMA Yuka;TAKAHASHI Hironobu;OKAZAKI Kenichi
分类号 H01L29/786;H01L29/51;H01L29/49 主分类号 H01L29/786
代理机构 代理人
主权项 1. A semiconductor device comprising: a first insulating film; an oxide semiconductor film comprising a channel formation region over the first insulating film; a second insulating film over the oxide semiconductor film and comprising a first opening and a second opening; and a pair of conductive films electrically connected to the oxide semiconductor film respectively through the first opening and the second opening, wherein the second insulating film has a stacked-layer structure including a first film and a second film, and wherein the second insulating film overlaps the channel formation region and an end portion of the oxide semiconductor film.
地址 Kanagawa-ken JP