发明名称 |
Semiconductor Device |
摘要 |
A highly reliable semiconductor device which uses an oxide semiconductor film for a backplane is provided. A semiconductor device includes a first conductive film, a first insulating film over the first conductive film, an oxide semiconductor film which is over the first insulating film and overlaps with the first conductive film, a second insulating film over the oxide semiconductor film, and a pair of second conductive films electrically connected to the oxide semiconductor film through an opening portion included in the second insulating film. The second insulating film overlaps with a region of the oxide insulating film in which a carrier flows between the pair of second conductive films and overlaps with end portions of the oxide semiconductor film. |
申请公布号 |
US2015155387(A1) |
申请公布日期 |
2015.06.04 |
申请号 |
US201414556769 |
申请日期 |
2014.12.01 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Yamazaki Shunpei;KATAYAMA Masahiro;MISAWA Chieko;YOKOYAMA Yuka;TAKAHASHI Hironobu;OKAZAKI Kenichi |
分类号 |
H01L29/786;H01L29/51;H01L29/49 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a first insulating film; an oxide semiconductor film comprising a channel formation region over the first insulating film; a second insulating film over the oxide semiconductor film and comprising a first opening and a second opening; and a pair of conductive films electrically connected to the oxide semiconductor film respectively through the first opening and the second opening, wherein the second insulating film has a stacked-layer structure including a first film and a second film, and wherein the second insulating film overlaps the channel formation region and an end portion of the oxide semiconductor film. |
地址 |
Kanagawa-ken JP |