发明名称 ERROR CORRECTION CODE UNIT, SELF-TEST METHOD AND ASSOCIATED CONTROLLER APPLIED TO FLASH MEMORY DEVICE FOR GENERATING SOFT INFORMATION
摘要 A self-test method of a flash memory device includes: generating input data; encoding the input data to generate an error correction code; utilizing the input data and the error correction code to simulate to read a page of a flash memory of the flash memory device to generate soft information; and decoding the soft information to generate a decoding result.
申请公布号 US2015155058(A1) 申请公布日期 2015.06.04
申请号 US201414551060 申请日期 2014.11.23
申请人 Silicon Motion Inc. 发明人 Weng Chen-Yu
分类号 G11C29/48;G06F11/10 主分类号 G11C29/48
代理机构 代理人
主权项 1. An error correction code (ECC) unit of a flash memory device, comprising: an encoder, for receiving input data and encoding the received input data to generate an error correction code; a self-test circuit, coupled to the encoder, the self-test circuit arranged for generating the input data to the encoder, receiving the error correction code from the encoder, and utilizing the input data and the error correction code to simulate to read a page of a flash memory of the flash memory device to generate soft information; and a decoder, coupled to the self-test circuit, the decoder arranged for receiving the soft information and decoding the soft information to generate a decoding result.
地址 Hsinchu County TW