| 摘要 |
Provided is the following static elimination member for analysis. In precision analysis such as analysis involving using an atomic force microscope, the static elimination member for analysis can be sufficiently attached to the periphery of a sample to be analyzed, and can suppress the charging of the periphery of the sample to be analyzed without contaminating the sample to be analyzed or its surrounding environment. Even when a metal is present around the sample to be analyzed, the member eliminates the possibility of a spark. The member enables the analysis of the sample while the sample is covered with a chamber. The member enables the analysis thereof under a high-temperature environment or a vacuum environment without problems. The static elimination member for analysis of the present invention includes a fibrous columnar structure including a plurality of fibrous columnar objects. |
