发明名称 Method, apparatus and system for tessellating a parametric patch
摘要 A method of tessellating a parametric patch (610) of an object is disclosed. A boundary curve associated with the parametric patch (610) is vectorised according to a pre-determined flatness tolerance. A tessellation point associated with a first parametric value inside the parametric patch (610) is determined based on geometry of the parametric patch (610) and a tessellation step. A curve associated with the first parametric value is determined based on the geometry of the parametric patch (610) and the tessellation step. A colour split point on the vectorised boundary curve is determined. The colour split point is determined based on the vectorised boundary curve and the determined curve associated with the first parametric value. The parametric patch (610) is tessellated by joining the colour split point and the tessellation point.
申请公布号 US2015154797(A1) 申请公布日期 2015.06.04
申请号 US201414559409 申请日期 2014.12.03
申请人 CANON KABUSHIKI KAISHA 发明人 SOULARD Hervé;Liu Jun;Coker Andrew R.;Mandal Abhijit
分类号 G06T17/20 主分类号 G06T17/20
代理机构 代理人
主权项 1. A method of tessellating a parametric patch of an object, said method comprising: vectorising a boundary curve associated with the parametric patch according to a pre-determined flatness tolerance; determining a tessellation point associated with a first parametric value inside the parametric patch based on geometry of the parametric patch and a tessellation step; determining a curve associated with the first parametric value based on the geometry of the parametric patch and the tessellation step; determining a colour split point on the vectorised boundary curve, the colour split point being determined based on the vectorised boundary curve and the determined curve associated with the first parametric value; and tessellating the parametric patch by joining the colour split point and the tessellation point.
地址 Tokyo JP