发明名称 ILLUMINATION SYSTEM OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
摘要 The disclosure relates to an illumination system of a microlithographic projection exposure apparatus. The illumination system can include a depolariser which in conjunction with a light mixing system disposed downstream in the light propagation direction at least partially causes effective depolarisation of polarised light impinging on the depolariser. The illumination system can also include a microlens array which is arranged upstream of the light mixing system in the light propagation direction. The microlens array can include a plurality of microlenses arranged with a periodicity. The depolariser can be configured so that a contribution afforded by interaction of the depolariser with the periodicity of the microlens array to a residual polarisation distribution occurring in a pupil plane arranged downstream of the microlens array in the light propagation direction has a maximum degree of polarisation of not more than 5%.
申请公布号 US2015153654(A1) 申请公布日期 2015.06.04
申请号 US201414563087 申请日期 2014.12.08
申请人 Carl Zeiss SMT GmbH 发明人 Fiolka Damian;Maul Manfred;Schwab Markus;Seitz Wolfgang;Dittmann Olaf
分类号 G03F7/20;G02B27/28 主分类号 G03F7/20
代理机构 代理人
主权项
地址 Oberkochen DE