| 摘要 |
<p>The invention relates to an optical microscope system (10) for the simultaneous measurement of at least two spatially distinct regions of interest, characterised by comprising at least two distinct optical measuring heads (12a, 12b, 12c) that can be simultaneously focused on spatially distinct arbitrary regions of interest, each optical measuring head is optically connectable with at least one scan head (14), the optical microscope system further comprising a control system (32) connected to the at least one scan head and the optical measuring head, the control system being configured to provide for synchronised control of the operation of the at least one scan head and the at least two optical measuring head.</p> |
