发明名称 テスト仕様生成装置、テスト仕様生成方法、およびプログラム
摘要 <p>Provided is a test specification generator comprising: a test information storage unit which can store test information that is information used in a test; a specification description information storage unit which can store specification description information that is information related to a target specification described in a specification description language constituting a language for describing the target specification, that is information including at least one variable declaration, and that is information including test source information for generating the test information; a test information acquisition unit that uses the variable declaration and test source information to acquire at least one item of the test information having at least the input value of at least one variable; and a test information accumulation unit for accumulating, in the test information storage unit, at least one item of the test information acquired by the test information acquisition unit. Thus, if information for test design is described at the time of the target design, information related to the appropriate test specification can be automatically generated.</p>
申请公布号 JP5729465(B2) 申请公布日期 2015.06.03
申请号 JP20130505910 申请日期 2012.03.13
申请人 发明人
分类号 G06F11/36 主分类号 G06F11/36
代理机构 代理人
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