发明名称 INTERFEROMETER AND EXPOSURE APPARATUS INCLUDING THE SAME
摘要 <p>An interferometer comprises: an optical unit; an environment measurement unit to measure an environmental condition in a chamber; and a signal processing unit to measure a position of a stage. The optical unit separates a first light having a first wavelength into a reference light and a measurement light to generate a first interference signal based on a first reflected light as the reflected reference light from a reference mirror and a second reflected light as the reflected measurement light from a stage mirror. The signal processing unit calculates a correction factor of the chamber based on the environmental conditions; corrects the first interference signal into a second interference signal based on a correction factor; and measures a position of the stage based on the second interference signal.</p>
申请公布号 KR20150060420(A) 申请公布日期 2015.06.03
申请号 KR20130144815 申请日期 2013.11.26
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 KIM, CHA DONG;KIM, CHANG HOON;PARK, JUNG IN;YUN, SANG HYUN;LEE, KI BEOM;LEE, HI KUK;CHANG, JAE HYUK
分类号 G01B9/02;G03F7/20;H01L21/027 主分类号 G01B9/02
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