| 摘要 |
According to one embodiment, an alignment method includes setting a local area from an alignment target area, the local area being an execution target area of local alignment to be performed with precision equal to or higher than required alignment precision; performing the local alignment between a pattern image of an examination target and a reference pattern image of an examination reference, in the local area, to obtain a shift amount that is a result of local alignment; and shifting a whole of the reference pattern image by using the shift amount. |
