发明名称 |
CMP SLURRY COMPOSITION HAVING AUTOMATIC POLISHING STOP FUNCTION |
摘要 |
<p>The present invention relates to a CMP slurry composition having an automatic polishing stop function, which maintains positive zeta potential when mixing an additive composition and a slurry composition, has high polishing selectivity since a step removing rate is rapid in an oxide film when polishing a double membrane, and can implement the automatic polishing stop function and polishing flatness since a polishing rate slows down when a nitride layer is exposed after removing step.</p> |
申请公布号 |
KR101524626(B1) |
申请公布日期 |
2015.06.03 |
申请号 |
KR20130155194 |
申请日期 |
2013.12.13 |
申请人 |
K.C.TECH CO., LTD. |
发明人 |
KWON, JANG KUK;LEE, SUNG PYO;CHOI, NAK HYOUN;JUNG, KI HWA |
分类号 |
C09K3/14;H01L21/304 |
主分类号 |
C09K3/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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