发明名称 CMP SLURRY COMPOSITION HAVING AUTOMATIC POLISHING STOP FUNCTION
摘要 <p>The present invention relates to a CMP slurry composition having an automatic polishing stop function, which maintains positive zeta potential when mixing an additive composition and a slurry composition, has high polishing selectivity since a step removing rate is rapid in an oxide film when polishing a double membrane, and can implement the automatic polishing stop function and polishing flatness since a polishing rate slows down when a nitride layer is exposed after removing step.</p>
申请公布号 KR101524626(B1) 申请公布日期 2015.06.03
申请号 KR20130155194 申请日期 2013.12.13
申请人 K.C.TECH CO., LTD. 发明人 KWON, JANG KUK;LEE, SUNG PYO;CHOI, NAK HYOUN;JUNG, KI HWA
分类号 C09K3/14;H01L21/304 主分类号 C09K3/14
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