发明名称 Semiconductor device with buried gates and method for fabricating the same
摘要 A semiconductor device includes a supplementary layer and a silicon layer stacked over a substrate, a trench penetrating the supplementary layer and the silicon layer and formed over the substrate, a gate insulation layer formed along a surface of the trench, and a buried gate formed over the gate insulation layer and filling a portion of the trench.
申请公布号 US9048218(B2) 申请公布日期 2015.06.02
申请号 US201012939534 申请日期 2010.11.04
申请人 Hynix Semiconductor Inc. 发明人 Lee Seung-Ryong;Ahn Tae-Hang
分类号 H01L29/732;H01L29/423;H01L29/165;H01L29/78 主分类号 H01L29/732
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A semiconductor device, comprising: a supplementary layer formed over a substrate; a silicon layer formed over the supplementary layer; a trench penetrating the supplementary layer and the silicon layer and formed in the substrate; a gate insulation layer formed along a surface of the trench; a buried gate formed over the gate insulation layer and filling a portion of the trench; and a junction region used as source region and drain region formed in the silicon layer and on both sides of the trench, wherein the junction region is spaced apart from the buried gate by at least a thickness of the supplementary layer, wherein a top surface of the buried gate is disposed below a bottom surface of the supplementary layer.
地址 Gyeonggi-do KR