发明名称 |
Semiconductor device with buried gates and method for fabricating the same |
摘要 |
A semiconductor device includes a supplementary layer and a silicon layer stacked over a substrate, a trench penetrating the supplementary layer and the silicon layer and formed over the substrate, a gate insulation layer formed along a surface of the trench, and a buried gate formed over the gate insulation layer and filling a portion of the trench. |
申请公布号 |
US9048218(B2) |
申请公布日期 |
2015.06.02 |
申请号 |
US201012939534 |
申请日期 |
2010.11.04 |
申请人 |
Hynix Semiconductor Inc. |
发明人 |
Lee Seung-Ryong;Ahn Tae-Hang |
分类号 |
H01L29/732;H01L29/423;H01L29/165;H01L29/78 |
主分类号 |
H01L29/732 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A semiconductor device, comprising:
a supplementary layer formed over a substrate; a silicon layer formed over the supplementary layer; a trench penetrating the supplementary layer and the silicon layer and formed in the substrate; a gate insulation layer formed along a surface of the trench; a buried gate formed over the gate insulation layer and filling a portion of the trench; and a junction region used as source region and drain region formed in the silicon layer and on both sides of the trench, wherein the junction region is spaced apart from the buried gate by at least a thickness of the supplementary layer, wherein a top surface of the buried gate is disposed below a bottom surface of the supplementary layer. |
地址 |
Gyeonggi-do KR |