发明名称 Methods for wet clean of oxide layers over epitaxial layers
摘要 Methods for an oxide layer over an epitaxial layer. In an embodiment, a method includes forming an epitaxial layer of semiconductor material over a semiconductor substrate; forming an oxide layer over the epitaxial layer; applying a solution including an oxidizer to the oxide layer; and cleaning the oxide layer with a cleaning solution. In another embodiment, a densification process is applied to an oxide layer including treating with thermal energy, UV energy, or both. In an embodiment for a gate-all-around device, the cleaning process is applied to an oxide layer over an epitaxial portion of a fin. Additional methods are disclosed.
申请公布号 US9048087(B2) 申请公布日期 2015.06.02
申请号 US201313924193 申请日期 2013.06.21
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Wu Li-Lan;Chen Chi-Yuan;Liu Ming-Chyi;Lo Cary Chia-Chiung;Tsai Teng-Chun;Lin Cheng-Tung;Lin Kuo-Yin;Wang Li-Ting;Pan Wan-Chun;Yen Ming-Liang;Chang Huicheng
分类号 H01L21/336;H01L21/02;H01L29/66;H01L29/775;B82Y10/00;H01L21/3105 主分类号 H01L21/336
代理机构 Slater & Matsil, L.L.P 代理人 Slater & Matsil, L.L.P
主权项 1. A method, comprising: forming an epitaxial layer of semiconductor material over a semiconductor substrate; forming an oxide layer over the epitaxial layer; applying a solution including an oxidizer to the oxide layer; and cleaning the oxide layer with a cleaning solution.
地址 Hsin-Chu TW