发明名称 Electron beam device with dispersion compensation, and method of operating same
摘要 An electron beam device comprises: a beam emitter for emitting a primary electron beam; an objective electron lens for focusing the primary electron beam onto a specimen, the objective lens defining an optical axis; a beam separator having a first dispersion for separating a signal electron beam from the primary electron beam; and a dispersion compensation element. The dispersion compensation element has a second dispersion, the dispersion compensation element being adapted for adjusting the second dispersion independently of an inclination angle of the primary beam downstream of the dispersion compensation element, such that the second dispersion substantially compensates the first dispersion. The dispersion compensation element is arranged upstream, along the primary electron beam, of the beam separator.
申请公布号 US9048068(B2) 申请公布日期 2015.06.02
申请号 US201012776980 申请日期 2010.05.10
申请人 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik GmbH 发明人 Lanio Stefan;Schoenecker Gerald
分类号 H01J37/28;H01J37/147;H01J37/153 主分类号 H01J37/28
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. An electron beam device, comprising: a beam emitter for emitting a primary electron beam; an objective electron lens for focusing the primary electron beam onto a specimen, the objective lens defining an optical axis; a magnetic beam separator having a magnetic element as the only deflecting element, wherein the magnetic beam separator has a first dispersion and separates a signal electron beam from the primary electron beam; and a dispersion compensation element having a second dispersion and arranged upstream of the magnetic beam separator along the primary electron beam, wherein the dispersion compensation element adjusts the second dispersion independently of an inclination angle of the primary electron beam to compensate for the first dispersion, and wherein the dispersion compensation element comprises a first deflector and a second deflector, wherein the first deflector is a magnetic deflector and the second deflector is an electrostatic deflector, wherein the first and second deflectors are adapted for deflecting the electron beam in mutually opposite directions such that dispersions of the first and second deflectors do not cancel each other.
地址 Heimstetten DE