发明名称 Semiconductor device
摘要 A semiconductor device includes a substrate, a buried insulating film formed on the substrate, an SOI layer formed on the buried insulating film, an insulating film formed to extend from a top surface of the SOI layer to the buried insulating film and to divide the SOI layer into a first SOI layer and a second SOI layer isolated from the first SOI layer, an element formed in the first SOI layer, and an electrode having at one end thereof a pad located directly above the second SOI layer, the other end of the electrode being connected to the first SOI layer. A cavity region is formed between the buried insulating film and the substrate directly below the first SOI layer. The portion of the buried insulating film directly below the second SOI layer is at least partially in direct contact with the substrate.
申请公布号 US9048111(B2) 申请公布日期 2015.06.02
申请号 US201414253269 申请日期 2014.04.15
申请人 Mitsubishi Electric Corporation 发明人 Yamashita Junichi;Terashima Tomohide
分类号 H01L29/06;H01L21/762;H01L27/12 主分类号 H01L29/06
代理机构 Studebaker & Brackett PC 代理人 Studebaker & Brackett PC
主权项 1. A semiconductor device comprising: a substrate; a buried insulating film formed on said substrate; an SOI layer formed on said buried insulating film; an insulating film formed to extend from a top surface of said SOI layer to said buried insulating film and to divide said SOI layer into a first SOI layer and a second SOI layer isolated from said first SOI layer; an element formed in said first SOI layer; and an electrode having at one end thereof a pad located directly above said second SOI layer, the other end of said electrode being connected to said first SOI layer; wherein a cavity region is formed between said buried insulating film and said substrate directly below said first SOI layer; and wherein the portion of said buried insulating film directly below said second SOI layer is at least partially in direct contact with said substrate.
地址 Tokyo JP
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