发明名称 Manufacturing method of non-volatile memory
摘要 A non-volatile memory and a manufacturing method thereof are provided. In this method, a first oxide layer having a protrusion is formed on a substrate. A pair of doped regions is formed in the substrate at two sides of the protrusion. A pair of charge storage spacers is formed on the sidewalls of the protrusion. A second oxide layer is formed on the first oxide layer and the pair of charge storage spacers. A conductive layer is formed on the second oxide layer, wherein the conductive layer is located completely on the top of the pair of charge storage spacers.
申请公布号 US9048263(B2) 申请公布日期 2015.06.02
申请号 US201414314830 申请日期 2014.06.25
申请人 MACRONIX International Co., Ltd. 发明人 Cheng Chih-Chieh;Yan Shih-Guei;Cheng Cheng-Hsien;Tsai Wen-Jer
分类号 H01L21/8247;H01L29/66;H01L29/423;H01L29/788;H01L29/792;H01L27/115 主分类号 H01L21/8247
代理机构 J.C. Patents 代理人 J.C. Patents
主权项 1. A manufacturing method of a non-volatile memory, comprising: forming a first oxide layer on a substrate, the first oxide layer having a protrusion; forming a pair of doped regions in the substrate at two sides of the protrusion; forming a pair of charge storage spacers on the sidewalls of the protrusion; forming a second oxide layer on the first oxide layer and the pair of charge storage spacers; and forming a gate on the second oxide layer, wherein the gate is located completely above the topmost portion of the pair of charge storage spacers.
地址 Hsinchu TW