发明名称 |
Manufacturing method of non-volatile memory |
摘要 |
A non-volatile memory and a manufacturing method thereof are provided. In this method, a first oxide layer having a protrusion is formed on a substrate. A pair of doped regions is formed in the substrate at two sides of the protrusion. A pair of charge storage spacers is formed on the sidewalls of the protrusion. A second oxide layer is formed on the first oxide layer and the pair of charge storage spacers. A conductive layer is formed on the second oxide layer, wherein the conductive layer is located completely on the top of the pair of charge storage spacers. |
申请公布号 |
US9048263(B2) |
申请公布日期 |
2015.06.02 |
申请号 |
US201414314830 |
申请日期 |
2014.06.25 |
申请人 |
MACRONIX International Co., Ltd. |
发明人 |
Cheng Chih-Chieh;Yan Shih-Guei;Cheng Cheng-Hsien;Tsai Wen-Jer |
分类号 |
H01L21/8247;H01L29/66;H01L29/423;H01L29/788;H01L29/792;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
J.C. Patents |
代理人 |
J.C. Patents |
主权项 |
1. A manufacturing method of a non-volatile memory, comprising:
forming a first oxide layer on a substrate, the first oxide layer having a protrusion; forming a pair of doped regions in the substrate at two sides of the protrusion; forming a pair of charge storage spacers on the sidewalls of the protrusion; forming a second oxide layer on the first oxide layer and the pair of charge storage spacers; and forming a gate on the second oxide layer, wherein the gate is located completely above the topmost portion of the pair of charge storage spacers. |
地址 |
Hsinchu TW |