Universal spring contact pin and IC test socket therefor

摘要

A universal spring contact pin for use in an IC test Socket includes a depressible probe member at one end and a fixed probe member at the other end. The fixed probe member preferably has a projection length chosen to allow z-axis loading of different surface mount package types within the same test socket. It also can have a relatively large tip angle which preferably terminates at a relatively sharp termination point. Preferably, the tip angle is about 90 degrees and the radius of the termination point of the tip is about 0.001 inches (0.0254 millimeters) or less.

主权项

1. A spring contact pin for an IC test socket comprising
a spring barrel having a first barrel end and a second barrel end, a barrel spring in said spring barrel, a first conductive probe member projecting from the first barrel end of said spring barrel and being depressible into said spring barrel against said compression spring from a fully extended position to a compressed position, and a second conductive probe member projecting from the second barrel end of said spring barrel for making contact with a lead of a device under test (DUT), said second conductive probe member being non-depressibly fixed in relation to said spring barrel and including a tip end having a conical surface, said conical surface forming a tip angle for said tip end of between about 75 and 105 degrees and terminating at a termination point substantially centered at said tip end.