发明名称 Semiconductor device and method of embedding thermally conductive layer in interconnect structure for heat dissipation
摘要 A semiconductor device has a first thermally conductive layer formed over a first surface of a semiconductor die. A second surface of the semiconductor die is mounted to a sacrificial carrier. An encapsulant is deposited over the first thermally conductive layer and sacrificial carrier. The encapsulant is planarized to expose the first thermally conductive layer. A first insulating layer is formed over the second surface of the semiconductor die and a first surface of the encapsulant. A portion of the first insulating layer over the second surface of the semiconductor die is removed. A second thermally conductive layer is formed over the second surface of the semiconductor die within the removed portion of the first insulating layer. An electrically conductive layer is formed within the insulating layer around the second thermally conductive layer. A heat sink can be mounted over the first thermally conductive layer.
申请公布号 US9048211(B2) 申请公布日期 2015.06.02
申请号 US201314017963 申请日期 2013.09.04
申请人 STATS ChipPAC, Ltd. 发明人 Pagaila Reza A.;Do Byung Tai;Chua Linda Pei Ee
分类号 H01L23/36;H01L21/56;H01L23/31;H01L23/367;H01L23/538;H01L25/065;H01L23/00;H01L23/48;H01L23/498 主分类号 H01L23/36
代理机构 Patent Law Group: Atkins and Associates, P.C. 代理人 Atkins Robert D.;Patent Law Group: Atkins and Associates, P.C.
主权项 1. A method of making a semiconductor device, comprising: providing a first semiconductor die; forming a first thermally conductive layer over the first semiconductor die; depositing an encapsulant over the first semiconductor die and first thermally conductive layer; and forming a second thermally conductive layer over the first semiconductor die opposite the first thermally conductive layer.
地址 Singapore SG