发明名称 |
COMPOSITION FOR FORMING TOPCOAT LAYER AND RESIST PATTERN FORMATION METHOD EMPLOYING THE SAME |
摘要 |
The present invention relates to a method for forming a pattern using extreme ultraviolet light, and provides a composition for forming a topcoat layer capable of generating an excellent pattern in an aspect of roughness and a pattern shape, and a method for forming a pattern employing the same. The present invention comprises a composition for forming a topcoat layer, which includes a graphene derivative and a solvent having a hydrophilic group, and provides a method for forming a pattern by exposing and developing a resist layer after applying the composition on the surface of a resist, wherein the composition may also include a polymer. |
申请公布号 |
KR20150059574(A) |
申请公布日期 |
2015.06.01 |
申请号 |
KR20140042023 |
申请日期 |
2014.04.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;AZ ELECTRONIC MATERIALS IP (JAPAN) KK |
发明人 |
KIM, HYUN WOO;OKAYASU TETSUO;WANG XIAOWEI;PARK, CHEOL HONG;PAWLOWSKI GEORG;HAMA YUSUKE |
分类号 |
G03F7/11;G03F7/00 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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