APPARATUS FOR MEASURING 3-DIMENSIONAL SHAPE OF OBJECT

摘要

An apparatus for measuring three dimensional shape of a target object using Moire patterns is disclosed. The apparatus for measuring three dimensional shape of a target object using Moire patterns comprises: a projection system having a first pattern projector to project a first light source onto the target object, a second pattern projector to project a second light source onto the target object, and a third pattern projector to project a third light source onto the target object; a Moire pattern acquisition unit having a first camera to measure a first Moire pattern formed on the target object by the first pattern projector and the second pattern projector and a second camera to measure a second Moire pattern formed on the target object by the second pattern projector and the third pattern projector; and a three dimensional shape generation unit to generate a three dimensional shape of the target object based on the first Moire pattern and the second Moire pattern.