| 摘要 |
<p>An embodiment of the present invention relates to a method for measuring a residual lifetime by checking an abrasion and a scratch on a surface of an OPC drum, and aims to simply and perfectly measure the scratch on the surface of the OPC drum. To this end, disclosed is a method for measuring a residual lifetime by checking the abrasion and the scratch on the surface of the OPC drum, comprising: a stack-type electrophotographic photoconductor which is sequentially equipped with a conductive tube made of aluminum, a resistance layer formed onto the conductive tube, a charge generation layer formed onto the resistance layer in a thickness of 3-5um, a charge transport layer formed onto the charge generation layer in a thickness of 20-30um, and an anti-abrasion layer formed onto the charge transport layer; a CIS developing device which forms an electrostatic latent image onto the surface of the electrophotographic photoconductor; a CIS developing device which develops the electrostatic latent image environment and forms a CIS visible image; and a main controller which controls the electrophotographic photoconductor, the CIS developing device, and an operation of the developing device, scans the surface of the electrophotographic photoconductor in CIS by using the CIS developing device, extracts the CIS visible image scanned and then formed by the CIS developing device, performs a refractive index compensation of the charge transport layer for the CIS visible image, and then determines the extent of the damage of the electrophotographic photoconductor in the CIS visible image compensated with the refractive index.</p> |
