斜轴式显微自动对焦系统及方法;BEVEL-AXIAL AUTO-FOCUS MICROSCOPIC SYSTEM AND METHOD THEREOF

摘要

本发明之实施例揭露一斜轴式显微自动对焦方法，包含：藉由摄影机撷取全幅斜轴输入影像资讯；藉由影像分析的技术，读取影像资讯，完成后再将相关灰阶化强度资讯提供统计分析模组提取影像统计特征，并进行机率函数的曲线拟合；以及根据拟合后的特征参数进行估测。本方法系采用影像结合高斯曲线拟合及卡曼滤波理论，由影像品质的权重函数以分析聚焦面的位置，并直接决定物体面最佳之聚焦位置修正值，可大幅改进传统对焦方式的准确度及速度。; using image analysis to read image information and transmitting grayscale information to a statistic analysis module; the statistic module extracting image statistic characteristics and performing curve fitting with probability function; and estimating the optimal focus point based on the post-fitting characteristic parameters. A preferred embodiment combines image with Gaussian curve fitting and Kalman filter, and analyzes the focus position based on image quality so as to directly determine the optimal rectification value of the focus position on the object surface. The method can improve the accuracy and speed of auto-focusing.