发明名称 ELECTRONICS DEVICE TEST SET AND CONTACT USED THEREIN
摘要 <p>A CONTACT FOR USE IN A TEST SET WHICH CAN BE MOUNTED TO A LOAD BOARD OF A TESTER APPARATUS. THE CONTACT, WHICH SERVES TO ELECTRICALLY CONNECT AT LEAST ONE LEAD OF A DEVICE BEING TESTED WITH A CORRESPONDING METALLIC TRACE ON THE LOAD BOARD, HAS A FIRST END DEFINING MULTIPLE CONTACT POINTS. AS THE CONTACT IS ROTATED ABOUT AN AXIS GENERALLY PERPENDICULAR TO A PLANE DEFINED BY THE CONTACT, SUCCESSIVE CONTACT POINTS ARE SEQUENTIALLY ENGAGED BY A LEAD OF THE DEVICE BEING TESTED.</p>
申请公布号 MY154288(A) 申请公布日期 2015.05.29
申请号 MY2007PI00275 申请日期 2007.02.23
申请人 JOHNSTECH INTERNATIONAL CORPORATION 发明人 DENNIS B. SHELL;MATHEW L. GILK;JOSE E. LOPEZ
分类号 G01R1/04 主分类号 G01R1/04
代理机构 代理人
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