发明名称 INTEGRATED CIRCUITS WITH SHALLOW TRENCH ISOLATIONS, AND METHODS FOR PRODUCING THE SAME
摘要 Integrated circuits with electrical components near shallow trench isolations and methods for producing such integrated circuits are provided. The method includes forming a trench is a substrate, where the trench has a trench surface. A barrier layer including silicon and germanium is formed overlying the trench surface. A shallow trench isolation is then formed with a core overlying the barrier layer, where the core includes a shallow trench isolation insulator.
申请公布号 US2015145000(A1) 申请公布日期 2015.05.28
申请号 US201314092232 申请日期 2013.11.27
申请人 GLOBALFOUNDRIES, Inc. 发明人 Yan Ran;Sassiat Nicolas;Zaka Alban;Lin Kun-Hsien
分类号 H01L21/762;H01L29/78;H01L29/66;H01L29/06 主分类号 H01L21/762
代理机构 代理人
主权项 1. A method of producing an integrated circuit comprising: forming a trench in a substrate, wherein the trench comprises a trench surface; forming a barrier layer overlying the trench surface, wherein the barrier layer comprises silicon and germanium; and forming a shallow trench isolation by forming a core overlying the barrier layer, wherein the core comprises a shallow trench isolation insulator.
地址 Grand Cayman KY US
您可能感兴趣的专利