发明名称 |
INTEGRATED CIRCUITS WITH SHALLOW TRENCH ISOLATIONS, AND METHODS FOR PRODUCING THE SAME |
摘要 |
Integrated circuits with electrical components near shallow trench isolations and methods for producing such integrated circuits are provided. The method includes forming a trench is a substrate, where the trench has a trench surface. A barrier layer including silicon and germanium is formed overlying the trench surface. A shallow trench isolation is then formed with a core overlying the barrier layer, where the core includes a shallow trench isolation insulator. |
申请公布号 |
US2015145000(A1) |
申请公布日期 |
2015.05.28 |
申请号 |
US201314092232 |
申请日期 |
2013.11.27 |
申请人 |
GLOBALFOUNDRIES, Inc. |
发明人 |
Yan Ran;Sassiat Nicolas;Zaka Alban;Lin Kun-Hsien |
分类号 |
H01L21/762;H01L29/78;H01L29/66;H01L29/06 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
1. A method of producing an integrated circuit comprising:
forming a trench in a substrate, wherein the trench comprises a trench surface; forming a barrier layer overlying the trench surface, wherein the barrier layer comprises silicon and germanium; and forming a shallow trench isolation by forming a core overlying the barrier layer, wherein the core comprises a shallow trench isolation insulator. |
地址 |
Grand Cayman KY US |