发明名称 VERTICAL SEMICONDUCTOR DEVICES INCLUDING SUPERLATTICE PUNCH THROUGH STOP LAYER AND RELATED METHODS
摘要 A semiconductor device may include a substrate, and a plurality of fins spaced apart on the substrate. Each of the fins may include a lower semiconductor fin portion extending vertically upward from the substrate, and at least one superlattice punch-through layer on the lower fin portion. The superlattice punch-through layer may include a plurality of stacked groups of layers, with each group of layers of the superlattice punch-through layer comprising a plurality of stacked base semiconductor monolayers defining a base semiconductor portion and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions. Each fin may also include an upper semiconductor fin portion on the at least one superlattice punch-through layer and extending vertically upward therefrom. The semiconductor device may also include source and drain regions at opposing ends of the fins, and a gate overlying the fins.
申请公布号 US2015144877(A1) 申请公布日期 2015.05.28
申请号 US201414550244 申请日期 2014.11.21
申请人 MEARS Technologies, Inc. 发明人 Mears Robert;Takeuchi Hideki;Trautmann Erwin
分类号 H01L27/088;H01L21/324;H01L29/165;H01L29/10;H01L21/8234;H01L29/15 主分类号 H01L27/088
代理机构 代理人
主权项 1. A method for making a semiconductor device comprising: forming a plurality of fins on a substrate by forming a plurality of spaced apart lower semiconductor fin portions extending vertically upward from the substrate,forming at least one respective superlattice punch-through stop layer on each of the lower fin portions, each superlattice punch-through stop layer including a plurality of stacked groups of layers, each group of layers of the superlattice punch-through stop layer comprising a plurality of stacked base semiconductor monolayers defining a base semiconductor portion and at least one non-semiconductor monolayer constrained within a crystal lattice of adjacent base semiconductor portions, andforming a respective upper semiconductor fin portion on each of the at least one superlattice punch-through stop layers and extending vertically upward therefrom; forming source and drain regions at opposing ends of the fins; and forming a gate overlying the fins.
地址 Newton MA US