| 发明名称 |
IDENTIFYING A CHANGE TO INDICATE A DEGRADATION WITHIN A COMPUTING DEVICE |
| 摘要 |
Examples disclose a method to collect a first property and a second property of a computing device. The first property and the second property monitor a functionality of the computing device and are collected as a function of time. Further, the examples provide comparing the first property and the second property to identify a change indicating a degradation within the computing device. |
| 申请公布号 |
US2015149827(A1) |
申请公布日期 |
2015.05.28 |
| 申请号 |
US201214397216 |
申请日期 |
2012.04.30 |
| 申请人 |
Landry John;Rosa Cesar Augusto;DeRoos Stephen M.;Gagneraud Eric |
发明人 |
Landry John;Rosa Cesar Augusto;DeRoos Stephen M.;Gagneraud Eric |
| 分类号 |
G06F11/34 |
主分类号 |
G06F11/34 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A computing system comprising:
a computing device comprising a profiler module to:
obtain a first profile including a first property of the computing device;obtain a second profile including a second property of the computing device, the first and the second profiles are obtained as a function of time; and a diagnostic module to:
analyze the first and the second profiles to identify a change between the first and the second properties, the change indicating a degradation within the computing device. |
| 地址 |
Spring TX US |
