发明名称 PATTERN EXTRACTING DEVICE, IMAGE PROJECTING DEVICE, PATTERN EXTRACTING METHOD, AND PROGRAM
摘要 A pattern extracting device, an image projecting device, a pattern extracting method, and a program capable of extracting all the feature points by interpolating defective feature points even when there are defective feature points of an image pattern. The pattern extracting device extracts feature points to be interpolated based on a captured image of a projected image pattern, and interpolates the feature point to be interpolated by using near-by feature points that are located near the feature point, divides the near-by feature points into groups, calculates extrapolation coordinates of the groups, and calculates coordinates of the feature point to be interpolated in view of significance of the extrapolation.
申请公布号 US2015146990(A1) 申请公布日期 2015.05.28
申请号 US201314401897 申请日期 2013.05.16
申请人 Uchiyama Yukinaka;Hasegawa Fumihiro 发明人 Uchiyama Yukinaka;Hasegawa Fumihiro
分类号 G06K9/46;G06T3/00;H04N9/31;G06T5/00 主分类号 G06K9/46
代理机构 代理人
主权项 1. A pattern extracting device for extracting an image pattern, the pattern extracting device comprising: an interpolation target extraction unit configured to extract a feature point to be interpolated based on a captured image of a projected image pattern; and an interpolation unit configured to interpolate the feature point to be interpolated by using near-by feature points which are located near the feature point to be interpolated.
地址 Tokyo JP