| 摘要 |
A measuring device for measuring damage in a structure is disclosed. The device comprises three or more capacitive electrodes and measuring means for measuring capacitance between the capacitive electrodes. The device further comprises memory means for storing results of the capacitance measurements and processing means for processing the stored results of the capacitance measurements for providing a profile representing an electric property relative to measurement depth. A method of assessing maintenance need of a structure is also disclosed. |
