发明名称 |
MANUFACTURING DEVICE AND MANUFACTURING METHOD OF GROUP III NITRIDE SEMICONDUCTOR DEVICE; AND MANUFACTURING METHOD OF SEMICONDUCTOR WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing device and manufacturing method of a group III nitride semiconductor device and a manufacturing method of a semiconductor wafer which are suitable for mass production and can grow the group III nitride semiconductor device under low temperature as comparison with the prior art.SOLUTION: A manufacturing device 1000 includes: a showerhead electrode 1100; a susceptor 1200 for supporting a growth substrate; a first gas supply pipe 1300; and a second gas supply pipe 1420. The first gas supply pipe 1300 has at least one or more first gas ejection ports and supplies an organic metal gas containing a group III metal as a first gas. A second gas supply pipe 1420 supplies a gas containing a nitride gas as a second gas. The showerhead electrode 1100 is arranged at a position further than the first gas ejection port of the first gas supply pipe 1300 when viewed from the susceptor 1200. |
申请公布号 |
JP2015099866(A) |
申请公布日期 |
2015.05.28 |
申请号 |
JP20130239590 |
申请日期 |
2013.11.20 |
申请人 |
NAGOYA UNIV |
发明人 |
HORI MASARU;KONDO HIROKI;ISHIKAWA KENJI;ODA OSAMU |
分类号 |
H01L21/205;C23C16/34;C23C16/455;C23C16/505 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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