发明名称 THERMAL IMAGE ANALYSIS APPARATUS, CONFIGURATION APPARATUS, THERMAL IMAGE ANALYSIS METHOD, AND CONFIGURATION METHOD
摘要 Disclosed are a thermal image analysis apparatus, a configuration apparatus, a thermal image analysis method, and a configuration method, which relate to the application field of thermal image detection. In the prior art, when different operation sequences are set for analysis regions, portions of a photographed object of analysis regions with a same number may be different, which brings a series of problems. By means of the thermal image analysis apparatus, the configuration apparatus, the thermal image analysis method and the configuration method, the display of a reference image is controlled in an infrared thermal image, and the reference image shows a specified shape characteristic of a photographed object; an analysis region is set, and the set analysis region is associated with information related to portion information, so that the set analysis region is regulated and is easy to understand, and the like.
申请公布号 WO2015074626(A1) 申请公布日期 2015.05.28
申请号 WO2014CN92221 申请日期 2014.11.25
申请人 WANG, HAO 发明人 WANG, HAO
分类号 G01J5/00;G01J5/02 主分类号 G01J5/00
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