发明名称 |
X-ray radiation detectors, methods of manufacturing the radiation detectors and radiation imaging systems including the radiation detectors |
摘要 |
<p>A X-ray radiation detector is disclosed which has a dual-layer structure photoconductor layer. The dual-layer structure consists of a first photoconductor layer (12) comprising a plurality of photosensitive particles and of a second photoconductor layer (22) on the first photoconductor layer (12), comprising a plurality of crystals obtained by crystal-growing photosensitive material. At least some of the plurality of photosensitive particles of the first photoconductor layer (12) may fill gaps between the plurality of crystals of the second photoconductor layer (22). A method of manufacturing the radiation detector may include: forming a first photoconductor layer (12) by applying paste, including solvent mixed with a plurality of photosensitive particles, to a first substrate (11); forming a second photoconductor layer (22) by crystal-growing photosensitive material on a second substrate (25); pressing the crystal-grown second photoconductor layer (22) on the first photoconductor layer (12) that is applied to the first substrate (11) and removing the solvent in the first photoconductor layer (12) via a drying process.</p> |
申请公布号 |
EP2843711(A3) |
申请公布日期 |
2015.05.27 |
申请号 |
EP20140181618 |
申请日期 |
2014.08.20 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD |
发明人 |
LEE, SEUNG-HYUP;KIM, SUN-IL;KIM, YOUNG;KIM, CHANG-JUNG |
分类号 |
H01L31/08;H01L27/146;H01L31/0272;H01L31/032;H01L31/0384 |
主分类号 |
H01L31/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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