X-ray imaging apparatus

摘要

To provide an X-ray imaging apparatus capable of easily adjusting the sensitivity or capable of easily extracting the amount of refraction of X-rays.;An X-ray imaging apparatus irradiating an object to be measured with an X-ray beam from an X-ray source that generates X-rays of a first energy and X-rays of a second energy different from the first energy to measure an image of the object to be measured includes an attenuator and a detector. The attenuator attenuates the X-ray beam transmitted through the object to be measured and is configured so as to vary the amount of attenuation of the X-rays depending on a position on which the X-ray beam is incident. The detector detects the X-ray beam transmitted through the attenuator and is configured so as to detect the X-rays of the first energy and the second energy.

主权项

1. An X-ray imaging apparatus irradiating an object to be measured with an X-ray beam from an X-ray source that generates X-rays of a first energy and X-rays of a second energy different from the first energy to measure an image of the object to be measured, the X-ray imaging apparatus comprising:
an attenuator configured to attenuate the X-ray beam transmitted through the object to be measured; and a detector including a pixel configured to detect the X-ray beam transmitted through the attenuator, wherein the attenuator is configured so as to vary an amount of attenuation of the X-rays depending on a position on which the X-ray beam is incident in an area corresponding to the pixel, wherein an intensity of the X-ray beam detected by the pixel varies depending on the position on which the X-ray beam is incident in the area corresponding to the pixel, and wherein the detector is configured so as to detect the X-rays of the first energy and the X-rays of the second energy.