发明名称 |
RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMERIC COMPOUND, COMPOUND |
摘要 |
The present invention relates to a resist composition which generates acid upon exposure, and exhibits solubility changed with respect to a developing solution under action of acid. The resist composition comprises a base component (A) which exhibits solubility changed with respect to a developing solution under action of acid. The base component (A) includes a polymeric compound (A1) having a structural unit (a0) represented by general formula (a0-0), wherein V^11 represents an aliphatic cyclic group with or without a substituent, R^1 represents a lactam-containing cyclic group or a sultam-containing cyclic group, Y^1 represents an oxygen atom (-O-), an ester bond (-C(-O)-O-) or a single bond, and W^2 represents a group formed by a polymerization reaction of a polymerizable group-containing group. |
申请公布号 |
KR20150056468(A) |
申请公布日期 |
2015.05.26 |
申请号 |
KR20140155827 |
申请日期 |
2014.11.11 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
ARAI MASATOSHI;UTSUMI YOSHIYUKI |
分类号 |
G03F7/039;G03F7/038 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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