IC, circuitry, and RF BIST system

摘要

An IC, a circuitry, and an RF BIST system are provided. The RF BIST system includes a test equipment, a module circuitry, and an IC. The IC is arranged to communicate with the module circuitry by an RF signal in response to a command signal from the test equipment, determine a test result by the RF signal, and report the test result to the test equipment, wherein the module circuitry is external to the IC and the test equipment.

主权项

1. An integrated circuit (IC), comprising: a test signal generator, arranged to generate a test signal in response to a command signal from an external test equipment, wherein the command signal informs the IC of a type of built-in-self-test (BIST) to perform, and wherein the test signal comprises a predetermined test pattern loaded according to the command signal; a transmitter, arranged to generate a radio frequency (RF) signal according to the test signal; and a test result analyzer, arranged to determine a test result by the RF signal, and report the test result to the external test equipment.