发明名称 Testing method using guided wave
摘要 A testing method using a guided wave generates a guided wave to propagate through a subject as a testing target in a longitudinal direction of the subject, detects a reflected wave of the guided wave and examines the subject on the basis of the reflected wave. The testing method includes the steps of (A) obtaining data for defect amount estimation beforehand indicating a relationship between a defect amount of the subject and a magnitude of a reflected wave, (B) generating a guided wave so as to propagate through the subject, and detecting a reflected wave of the guided wave, and (C) estimating a defect amount of the subject on the basis of the data for defect amount estimation obtained at (A) and the magnitude of the guided wave detected at (B).
申请公布号 US9038472(B2) 申请公布日期 2015.05.26
申请号 US201013574151 申请日期 2010.02.12
申请人 IHI Inspection and Instrumentation Co., Ltd. 发明人 Daikoku Koki;Yoshizaki Masato;Sato Shuichi
分类号 G01N29/36;G01N29/24;G01N29/11;G01N29/44 主分类号 G01N29/36
代理机构 Griffin & Szipl, P.C. 代理人 Griffin & Szipl, P.C.
主权项 1. A testing method using a guided wave, of generating a guided wave to propagate through a subject as a testing target in a longitudinal direction of the subject, detecting a reflected wave of the guided wave and examining the subject on a basis of the reflected wave, comprising the steps of: (A) obtaining data for defect amount estimation beforehand indicating a relationship between a width of a defect part in a longitudinal direction of a subject and duration of a reflected wave; (B) generating a guided wave so as to propagate through the subject, and detecting a reflected wave of the generated guided wave; (C) estimating a width of a defect part in the longitudinal direction of the subject on based on the data for defect amount estimation obtained in step (A) and duration of the reflected wave detected in step (B); (D) obtaining three-variables correspondence data beforehand indicating a relationship among amplitude of a reflected wave, a width of a defect part in the longitudinal direction of the subject and a cross-sectional area of the defect part taken along a plane orthogonal to the longitudinal direction of the subject; and (E) estimating a cross-sectional area of the defect part taken along a plane orthogonal to the longitudinal direction of the subject based on the width of the defect part in the longitudinal direction of the subject estimated in step (C), and the amplitude of the reflected wave detected in step (B) and the three-variables correspondence data obtained in step (D).
地址 Tokyo JP