发明名称 Feature value estimation device and corresponding method, and spectral image processing device and corresponding method
摘要 An estimation device is configured to estimate a feature value of a specific component contained in a sample and includes: a spectral estimation parameter storage module; a calibration parameter storage module; a multiband image acquirer; an optical spectrum operator configured to compute an optical spectrum from a multiband image using a spectral estimation parameter; and a calibration processor configured to compute the feature value from the optical spectrum using a calibration parameter.
申请公布号 US9041928(B2) 申请公布日期 2015.05.26
申请号 US201213472047 申请日期 2012.05.15
申请人 SEIKO EPSON CORPORATION 发明人 Kanai Masashi;Arai Yoshifumi
分类号 G01J3/46;G01N33/02;G01N21/25;G01N21/27;G01N21/31 主分类号 G01J3/46
代理机构 Oliff PLC 代理人 Oliff PLC
主权项 1. An estimation device configured to estimate a feature value of a specific component contained in a sample, comprising: a spectral estimation parameter storage module configured to store a spectral estimation parameter used to convert a plurality of band images in different wavelength bands into an optical spectrum; a calibration parameter storage module configured to store a calibration parameter used to convert the optical spectrum into the feature value; a multiband image acquirer configured to obtain a multiband image of the sample taken in a plurality of wavelength bands including at least a specified wavelength band for the specific component; an optical spectrum operator configured to compute the optical spectrum from the multiband image using the spectral estimation parameter stored in the spectral estimation parameter storage module; and a calibration processor configured to compute the feature value from the optical spectrum computed by the optical spectrum operator using the calibration parameter stored in the calibration parameter storage module.
地址 Tokyo JP