发明名称 |
Feature value estimation device and corresponding method, and spectral image processing device and corresponding method |
摘要 |
An estimation device is configured to estimate a feature value of a specific component contained in a sample and includes: a spectral estimation parameter storage module; a calibration parameter storage module; a multiband image acquirer; an optical spectrum operator configured to compute an optical spectrum from a multiband image using a spectral estimation parameter; and a calibration processor configured to compute the feature value from the optical spectrum using a calibration parameter. |
申请公布号 |
US9041928(B2) |
申请公布日期 |
2015.05.26 |
申请号 |
US201213472047 |
申请日期 |
2012.05.15 |
申请人 |
SEIKO EPSON CORPORATION |
发明人 |
Kanai Masashi;Arai Yoshifumi |
分类号 |
G01J3/46;G01N33/02;G01N21/25;G01N21/27;G01N21/31 |
主分类号 |
G01J3/46 |
代理机构 |
Oliff PLC |
代理人 |
Oliff PLC |
主权项 |
1. An estimation device configured to estimate a feature value of a specific component contained in a sample, comprising:
a spectral estimation parameter storage module configured to store a spectral estimation parameter used to convert a plurality of band images in different wavelength bands into an optical spectrum; a calibration parameter storage module configured to store a calibration parameter used to convert the optical spectrum into the feature value; a multiband image acquirer configured to obtain a multiband image of the sample taken in a plurality of wavelength bands including at least a specified wavelength band for the specific component; an optical spectrum operator configured to compute the optical spectrum from the multiband image using the spectral estimation parameter stored in the spectral estimation parameter storage module; and a calibration processor configured to compute the feature value from the optical spectrum computed by the optical spectrum operator using the calibration parameter stored in the calibration parameter storage module. |
地址 |
Tokyo JP |