发明名称 |
Semiconductor device and method of manufacturing the same |
摘要 |
Disclosed is a semiconductor device having a substrate including first and second regions. First interlayer insulation layers and conductive patterns alternately are stacked on a first region of the substrate. A second interlayer insulation layer covers the first interlayer insulation layers and the conductive patterns. A resistor is formed in the second interlayer insulation layer in the second region of the substrate. |
申请公布号 |
US9040374(B2) |
申请公布日期 |
2015.05.26 |
申请号 |
US201313830727 |
申请日期 |
2013.03.14 |
申请人 |
SK Hynix Inc. |
发明人 |
Lee Dong Kee |
分类号 |
H01L21/8234;H01L21/8244;H01L27/24;H01L27/06;H01L45/00 |
主分类号 |
H01L21/8234 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A semiconductor device, comprising:
a substrate including first and second regions; first interlayer insulation layers and conductive patterns alternately stacked in the first region of the substrate; a through hole passing through the first interlayer insulation layers and the conductive patterns; a channel layer formed in the through hole; a second interlayer insulation layer covering the first interlayer insulation layers and the conductive patterns; and a resistor formed in the second interlayer insulation layer in the second region of the substrate. |
地址 |
Gyeonggi-do KR |