发明名称 Semiconductor device and method of manufacturing the same
摘要 Disclosed is a semiconductor device having a substrate including first and second regions. First interlayer insulation layers and conductive patterns alternately are stacked on a first region of the substrate. A second interlayer insulation layer covers the first interlayer insulation layers and the conductive patterns. A resistor is formed in the second interlayer insulation layer in the second region of the substrate.
申请公布号 US9040374(B2) 申请公布日期 2015.05.26
申请号 US201313830727 申请日期 2013.03.14
申请人 SK Hynix Inc. 发明人 Lee Dong Kee
分类号 H01L21/8234;H01L21/8244;H01L27/24;H01L27/06;H01L45/00 主分类号 H01L21/8234
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A semiconductor device, comprising: a substrate including first and second regions; first interlayer insulation layers and conductive patterns alternately stacked in the first region of the substrate; a through hole passing through the first interlayer insulation layers and the conductive patterns; a channel layer formed in the through hole; a second interlayer insulation layer covering the first interlayer insulation layers and the conductive patterns; and a resistor formed in the second interlayer insulation layer in the second region of the substrate.
地址 Gyeonggi-do KR