发明名称 Data read circuit, a non-volatile memory device having the same, and a method of reading data from the non-volatile memory device
摘要 A non-volatile memory device including a cell array, which includes a plurality of memory cells, and a sense amplification circuit. The sense amplification circuit is configured to receive a data voltage of a memory cell, a first reference voltage and a second reference voltage during a data read operation of the memory cell, generate differential output signals based on a voltage level difference between the data voltage and the first and second reference voltages, and output the differential output signals as data read from the memory cell.
申请公布号 US9042152(B2) 申请公布日期 2015.05.26
申请号 US201213562871 申请日期 2012.07.31
申请人 Samsung Electronics Co., Ltd. 发明人 Kim Chan-kyung;Hwang Hong-sun;Park Chul-woo;Kang Sang-beom;Oh Hyung-rok
分类号 G11C11/00;G11C13/00;G11C11/16;G11C7/06;G11C7/08;G11C7/14;G11C11/56 主分类号 G11C11/00
代理机构 F. Chau & Associates, LLC 代理人 F. Chau & Associates, LLC
主权项 1. A method of reading data from a non-volatile memory device, comprising: receiving, at a first sense amplifier, a data voltage, a first reference voltage and a second reference voltage, wherein the data voltage corresponds to data stored in a memory cell; sensing, at the first sense amplifier, a voltage level difference between the data voltage and the first and second reference voltages to generate first and second differential output signals; and amplifying, at a second sense amplifier, the first and second differential output signals to generate read data for the memory cell.
地址 Suwon-si, Gyeonggi-do KR