发明名称 |
Data read circuit, a non-volatile memory device having the same, and a method of reading data from the non-volatile memory device |
摘要 |
A non-volatile memory device including a cell array, which includes a plurality of memory cells, and a sense amplification circuit. The sense amplification circuit is configured to receive a data voltage of a memory cell, a first reference voltage and a second reference voltage during a data read operation of the memory cell, generate differential output signals based on a voltage level difference between the data voltage and the first and second reference voltages, and output the differential output signals as data read from the memory cell. |
申请公布号 |
US9042152(B2) |
申请公布日期 |
2015.05.26 |
申请号 |
US201213562871 |
申请日期 |
2012.07.31 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Kim Chan-kyung;Hwang Hong-sun;Park Chul-woo;Kang Sang-beom;Oh Hyung-rok |
分类号 |
G11C11/00;G11C13/00;G11C11/16;G11C7/06;G11C7/08;G11C7/14;G11C11/56 |
主分类号 |
G11C11/00 |
代理机构 |
F. Chau & Associates, LLC |
代理人 |
F. Chau & Associates, LLC |
主权项 |
1. A method of reading data from a non-volatile memory device, comprising:
receiving, at a first sense amplifier, a data voltage, a first reference voltage and a second reference voltage, wherein the data voltage corresponds to data stored in a memory cell; sensing, at the first sense amplifier, a voltage level difference between the data voltage and the first and second reference voltages to generate first and second differential output signals; and amplifying, at a second sense amplifier, the first and second differential output signals to generate read data for the memory cell. |
地址 |
Suwon-si, Gyeonggi-do KR |