发明名称 APPARATUS AND METHOD FOR TREATING SUBSTRATE
摘要 The present invention provides a substrate treating apparatus. The substrate treating apparatus includes a first supply unit, a second supply unit, a first source, a second source, and a gas separating member. Plasma generated by the first source from a first gas supplied from the first supply unit is used for treating the center of the substrate. Plasma generated by the second source from a second gas supplied from the second supply unit is used for treating the edge of the substrate. The gas separating member prevents the plasma from the first gas and the plasma from the second gas from being mixed.
申请公布号 KR20150056321(A) 申请公布日期 2015.05.26
申请号 KR20130139201 申请日期 2013.11.15
申请人 PSK INC. 发明人 CHAE, HEE SUN;CHO, JEONG HEE;LEE, JONG SIK;LEE, HAN SAEM;KIM, HYUN JUN
分类号 H05H1/34;H01L21/205;H01L21/3065 主分类号 H05H1/34
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