发明名称 |
Testing a digital-to-analog converter |
摘要 |
Testing a digital-to-analog converter (DAC), where the test is carried out iteratively for a plurality of digital test signal values, includes: providing the digital test signal to a DAC under test and to a servo; providing, by the DAC under test to a summer, an analog test signal, including converting the digital test signal to the analog test signal; providing, by the summer to an observation latch, a summed signal, including summing the analog test signal and an analog offset signal, the analog offset signal received from a second DAC; providing, by the observation latch to the servo, a sample of the summed signal; providing, by the servo to the second DAC in dependence upon the sample and the digital test signal, a digital offset signal, where the second DAC converts the digital offset signal to the analog offset signal; and storing, as a digital observation, the digital offset signal. |
申请公布号 |
US9041572(B1) |
申请公布日期 |
2015.05.26 |
申请号 |
US201314089790 |
申请日期 |
2013.11.26 |
申请人 |
International Business Machines Corporation |
发明人 |
Atwood Eugene R.;Baecher Matthew B.;Kelly William R.;Logan Joseph F.;Sun Pinping |
分类号 |
H03M1/10;H03M1/66 |
主分类号 |
H03M1/10 |
代理机构 |
Kennedy Lenart Spraggins LLP |
代理人 |
Lenart Edward J.;Schnurmann H. Daniel;Kennedy Lenart Spraggins LLP |
主权项 |
1. A method of testing a digital-to-analog converter (DAC), the method carried out iteratively for a plurality of digital test signal values, the method comprising:
providing the digital test signal to a DAC under test and to a servo; providing, by the DAC under test to a summer, an analog test signal, including converting the digital test signal to the analog test signal; providing, by the summer to an observation latch, a summed signal, including summing the analog test signal and an analog offset signal, the analog offset signal received from a second DAC; providing, by the observation latch to the servo, a sample of the summed signal; providing, by the servo to the second DAC in dependence upon the sample and the digital test signal, a digital offset signal, wherein the second DAC converts the digital offset signal to the analog offset signal; and storing, as a digital observation, the digital offset signal. |
地址 |
Armonk NY US |