发明名称 Testing a digital-to-analog converter
摘要 Testing a digital-to-analog converter (DAC), where the test is carried out iteratively for a plurality of digital test signal values, includes: providing the digital test signal to a DAC under test and to a servo; providing, by the DAC under test to a summer, an analog test signal, including converting the digital test signal to the analog test signal; providing, by the summer to an observation latch, a summed signal, including summing the analog test signal and an analog offset signal, the analog offset signal received from a second DAC; providing, by the observation latch to the servo, a sample of the summed signal; providing, by the servo to the second DAC in dependence upon the sample and the digital test signal, a digital offset signal, where the second DAC converts the digital offset signal to the analog offset signal; and storing, as a digital observation, the digital offset signal.
申请公布号 US9041572(B1) 申请公布日期 2015.05.26
申请号 US201314089790 申请日期 2013.11.26
申请人 International Business Machines Corporation 发明人 Atwood Eugene R.;Baecher Matthew B.;Kelly William R.;Logan Joseph F.;Sun Pinping
分类号 H03M1/10;H03M1/66 主分类号 H03M1/10
代理机构 Kennedy Lenart Spraggins LLP 代理人 Lenart Edward J.;Schnurmann H. Daniel;Kennedy Lenart Spraggins LLP
主权项 1. A method of testing a digital-to-analog converter (DAC), the method carried out iteratively for a plurality of digital test signal values, the method comprising: providing the digital test signal to a DAC under test and to a servo; providing, by the DAC under test to a summer, an analog test signal, including converting the digital test signal to the analog test signal; providing, by the summer to an observation latch, a summed signal, including summing the analog test signal and an analog offset signal, the analog offset signal received from a second DAC; providing, by the observation latch to the servo, a sample of the summed signal; providing, by the servo to the second DAC in dependence upon the sample and the digital test signal, a digital offset signal, wherein the second DAC converts the digital offset signal to the analog offset signal; and storing, as a digital observation, the digital offset signal.
地址 Armonk NY US