发明名称 Flash Memory Embedded with HKMG Technology
摘要 An integrated circuit structure includes a flash memory cell and a logic MOS device. The flash memory cell includes a floating gate dielectric, a floating gate overlying the floating gate dielectric, a control gate overlying the floating gate, a word-line on a first side of the floating gate and the control gate, and an erase gate on a second side of the floating gate and the control gate. The logic MOS device includes a high-k gate dielectric, and a gate electrode over the high-k gate dielectric. The gate electrode, the control gate, the word-line, and the erase gate are formed of a same metal-containing material, and have top surfaces coplanar with each other.
申请公布号 US2015137207(A1) 申请公布日期 2015.05.21
申请号 US201414182642 申请日期 2014.02.18
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chuang Harry-Hak-Lay;Wu Wei Cheng
分类号 H01L29/49;H01L29/51;H01L27/115 主分类号 H01L29/49
代理机构 代理人
主权项 1. An integrated circuit structure comprising: a flash memory cell comprising: a floating gate dielectric;a floating gate overlying the floating gate dielectric;a control gate overlying the floating gate;a word-line on a first side of the floating gate and the control gate; andan erase gate on a second side of the floating gate and the control gate, wherein the control gate, the word-line, and the erase gate comprise a metal.
地址 Hsin-Chu TW