发明名称 EFFICIENT MODULATED IMAGING
摘要 An apparatus for turbid sample measurement comprising a plurality of light sources for illuminating a turbid sample target area with non-spatial structured light, a projection system for illuminating the turbid sample target area with spatial structured light, a sensor for collecting light from the turbid sample target area, and a processor to analyze the data captured by the sensor to yield scattering and absorption coefficients of the turbid sample. A method comprises illuminating the sample with spatial structured light, collecting light reflected from the sample at a number of wavelengths, illuminating the sample with non-spatial structured light, collecting light reflected from the sample at a number of wavelengths, and combining the measurements of the collected light to obtain the optical properties of the sample and/or the concentration of absorbing or fluorescent molecules. The wavelengths of the spatial and non-spatial light sources are preferably different.
申请公布号 US2015141839(A1) 申请公布日期 2015.05.21
申请号 US201414538776 申请日期 2014.11.11
申请人 MODULATED IMAGING, INC. 发明人 Cuccia David;Mazhar Amaan
分类号 A61B5/00 主分类号 A61B5/00
代理机构 代理人
主权项 1. An apparatus for the measurement of a turbid sample comprising a non-spatially structured light source, a spatially structured light source, a sensor configured to collect light from a target area of the turbid sample illuminated by the non-spatially structured light source and the spatial structure light source, and a processor configured to analyze the data captured by the sensor to yield the scattering and absorption coefficients of the turbid sample.
地址 Irvine CA US