发明名称 |
EFFICIENT MODULATED IMAGING |
摘要 |
An apparatus for turbid sample measurement comprising a plurality of light sources for illuminating a turbid sample target area with non-spatial structured light, a projection system for illuminating the turbid sample target area with spatial structured light, a sensor for collecting light from the turbid sample target area, and a processor to analyze the data captured by the sensor to yield scattering and absorption coefficients of the turbid sample. A method comprises illuminating the sample with spatial structured light, collecting light reflected from the sample at a number of wavelengths, illuminating the sample with non-spatial structured light, collecting light reflected from the sample at a number of wavelengths, and combining the measurements of the collected light to obtain the optical properties of the sample and/or the concentration of absorbing or fluorescent molecules. The wavelengths of the spatial and non-spatial light sources are preferably different. |
申请公布号 |
US2015141839(A1) |
申请公布日期 |
2015.05.21 |
申请号 |
US201414538776 |
申请日期 |
2014.11.11 |
申请人 |
MODULATED IMAGING, INC. |
发明人 |
Cuccia David;Mazhar Amaan |
分类号 |
A61B5/00 |
主分类号 |
A61B5/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. An apparatus for the measurement of a turbid sample comprising
a non-spatially structured light source, a spatially structured light source, a sensor configured to collect light from a target area of the turbid sample illuminated by the non-spatially structured light source and the spatial structure light source, and a processor configured to analyze the data captured by the sensor to yield the scattering and absorption coefficients of the turbid sample. |
地址 |
Irvine CA US |