发明名称 |
SEMICONDUCTOR DEVICE AND FABRICATING METHOD THEREOF |
摘要 |
A semiconductor device and a fabricating method thereof are provided. The semiconductor device fabricating method forms a first interfacial insulation layer and a first metal contact plug to penetrate the first interfacial insulation layer on a substrate; forms a second interfacial insulation layer and a first interfacial wiring to penetrate the second interfacial insulation layer and overlap with the first metal contact plug on the first metal contact plug; etches the second interfacial insulation layer using the first interfacial wiring as a mask until the first metal contact plug is exposed; forms a metal contact plug by etching a portion of the first metal contact plug exposed using the first interfacial wiring as a mask; and forms a third interfacial insulation layer to cover the first interfacial wiring. |
申请公布号 |
KR20150055385(A) |
申请公布日期 |
2015.05.21 |
申请号 |
KR20130137676 |
申请日期 |
2013.11.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, JE MIN |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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