发明名称 SEMICONDUCTOR DEVICE AND FABRICATING METHOD THEREOF
摘要 A semiconductor device and a fabricating method thereof are provided. The semiconductor device fabricating method forms a first interfacial insulation layer and a first metal contact plug to penetrate the first interfacial insulation layer on a substrate; forms a second interfacial insulation layer and a first interfacial wiring to penetrate the second interfacial insulation layer and overlap with the first metal contact plug on the first metal contact plug; etches the second interfacial insulation layer using the first interfacial wiring as a mask until the first metal contact plug is exposed; forms a metal contact plug by etching a portion of the first metal contact plug exposed using the first interfacial wiring as a mask; and forms a third interfacial insulation layer to cover the first interfacial wiring.
申请公布号 KR20150055385(A) 申请公布日期 2015.05.21
申请号 KR20130137676 申请日期 2013.11.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JE MIN
分类号 H01L21/28 主分类号 H01L21/28
代理机构 代理人
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