发明名称 DUAL ENDIANESS AND OTHER CONFIGURATION SAFETY IN LOCK STEP DUAL-CORE SYSTEM, AND OTHER CIRCUITS, PROCESSES AND SYSTEMS
摘要 An electronic circuit includes a microcontroller processor (410), a peripheral (420) coupled with the processor, an endian circuit (470) coupled with the processor and the peripheral to selectively provide different endianess modes of operation, and a detection circuit (140) to detect a failure to select a given endianess, whereby inadvertent switch of endianess due to faults is avoided. Other circuits, devices, systems, methods of operation and processes of manufacture are also disclosed.
申请公布号 US2015143181(A1) 申请公布日期 2015.05.21
申请号 US201514602933 申请日期 2015.01.22
申请人 Texas Instruments Incorporated 发明人 Xiao Yanyang;Palus Alexandre Pierre;Greb Karl Friedrich;Lavery Kevin Patrick;Krause Paul
分类号 G06F11/07 主分类号 G06F11/07
代理机构 代理人
主权项 1. An electronic circuit comprising: a microcontroller processor; a peripheral coupled with the processor; an endian circuit coupled with the processor and the peripheral to selectively provide different endianess modes of operation; and a detection circuit to detect a failure to select a given endianess, so that inadvertent switch of endianess due to faults is avoided.
地址 Dallas TX US