发明名称 |
DUAL ENDIANESS AND OTHER CONFIGURATION SAFETY IN LOCK STEP DUAL-CORE SYSTEM, AND OTHER CIRCUITS, PROCESSES AND SYSTEMS |
摘要 |
An electronic circuit includes a microcontroller processor (410), a peripheral (420) coupled with the processor, an endian circuit (470) coupled with the processor and the peripheral to selectively provide different endianess modes of operation, and a detection circuit (140) to detect a failure to select a given endianess, whereby inadvertent switch of endianess due to faults is avoided. Other circuits, devices, systems, methods of operation and processes of manufacture are also disclosed. |
申请公布号 |
US2015143181(A1) |
申请公布日期 |
2015.05.21 |
申请号 |
US201514602933 |
申请日期 |
2015.01.22 |
申请人 |
Texas Instruments Incorporated |
发明人 |
Xiao Yanyang;Palus Alexandre Pierre;Greb Karl Friedrich;Lavery Kevin Patrick;Krause Paul |
分类号 |
G06F11/07 |
主分类号 |
G06F11/07 |
代理机构 |
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代理人 |
|
主权项 |
1. An electronic circuit comprising:
a microcontroller processor; a peripheral coupled with the processor; an endian circuit coupled with the processor and the peripheral to selectively provide different endianess modes of operation; and a detection circuit to detect a failure to select a given endianess, so that inadvertent switch of endianess due to faults is avoided. |
地址 |
Dallas TX US |