发明名称 CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING THE SAME
摘要 A method of operating a charged particle beam system, the method comprises extracting a particle beam from a source; performing a first accelerating of the particles of the beam; forming a plurality of particle beamlets from the beam after the performing of the first accelerating; performing a second accelerating of the particles of the beamlets; performing a first decelerating of the particles of the beamlets after the performing of the second accelerating; deflecting the beamlets in a direction oriented transverse to a direction of propagation of the particles of the beamlets after the performing of the first decelerating; performing a second decelerating of the particles of the beamlets after the deflecting of the beamlets; and allowing the particles of the beamlets to be incident on an object surface after the performing of the second decelerating.
申请公布号 WO2015043769(A8) 申请公布日期 2015.05.21
申请号 WO2014EP02656 申请日期 2014.09.30
申请人 CARL ZEISS MICROSCOPY GMBH;APPLIED MATERIALS ISRAEL, LTD. 发明人 SCHUBERT, STEFAN;KEMEN, THOMAS;KNIPPELMEYER, RAINER
分类号 H01J37/28 主分类号 H01J37/28
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