OBJECT IMAGING METHOD AND INSPECTION SYSTEM

摘要

Provided are an object imaging method and a ray inspection system. The method comprises: in a single process where a ray source scans multiple areas of an object, the ray source and the object moving relative to each other; in the single scan process, the ray source switching in two or more working states and being provided with corresponding ray energy or a dosage rate; receiving rays that are transmitted or scattered through the object; based on the rays that are received, obtaining parts of a scanned image in one of the multiple areas under each working state of the ray source; and combining the obtained parts of the scanned image. Using the method and the system that are disclosed can consider requirements of an inspected object in different areas in a single scan process in a condition where no cost is increased so as to implement measurement on multiple areas in an object.