发明名称 HANDLER WAFER REMOVAL
摘要 <p>A method of removing a handler wafer. There is provided a handler wafer and a semiconductor device wafer having a plurality of semiconductor devices, the semiconductor device wafer having an active surface side and an inactive surface side. An amorphous carbon layer is applied to a surface of the handler wafer. An adhesive layer is applied to at least one of the amorphous carbon layer of the handler wafer and the active surface side of the semiconductor device wafer. The handler wafer is joined to the semiconductor device wafer through the adhesive layer or layers. Laser radiation is applied to the handler wafer to cause heating of the amorphous carbon layer that in turn causes heating of the adhesive layer or layers. The plurality of semiconductor devices of the semiconductor device wafer are then separated from the handler wafer.</p>
申请公布号 WO2015070684(A1) 申请公布日期 2015.05.21
申请号 WO2014CN88526 申请日期 2014.10.14
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;IBM (CHINA) CO., LIMITED 发明人 DANG, BING;KNICKERBOCKER, SARAH H.;LA TULIPE JR., DOUGLAS C.;SKORDAS, SPYRIDON;TSANG, CORNELIA K.;WINSTEL, KEVIN R.
分类号 H01L21/78 主分类号 H01L21/78
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