发明名称 IMPRINT LITHOGRAPHY METHOD AND APPARATUS
摘要 In an embodiment, there is provided an imprint lithography method that includes providing a first amount of imprintable medium on a first area of a substrate, the first amount of imprintable medium, when fixed, having a first etch rate; and providing a second amount of imprintable medium on a second, different area of the substrate, the second amount of imprintable medium, when fixed, having a second, different etch rate.
申请公布号 US2015136324(A1) 申请公布日期 2015.05.21
申请号 US201514605637 申请日期 2015.01.26
申请人 ASML NETHERLANDS B.V. 发明人 WUISTER Sander Frederik;Banine Vadim Yevgenyevich;Dijksman Johan Frederik;Kruijt-Stegeman Yvonne Wendela;Lammers Jeroen Herman;Koole Roelof
分类号 B29C43/34;B29C43/02;B29C43/58 主分类号 B29C43/34
代理机构 代理人
主权项
地址 Veldhoven NL